• Title of article

    Interfacial aqueous solutions dielectric constant measurements using atomic force microscopy

  • Author/Authors

    Teschke، نويسنده , , O. and Ceotto، نويسنده , , G. and de Souza، نويسنده , , E.F.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    7
  • From page
    328
  • To page
    334
  • Abstract
    The exchange of the volume of a region of the electric double layer of a mica surface immersed in aqueous solutions, with a dielectric constant ϵDL, by a nanosized radius tip, with a dielectric constant ϵTip, is responsible for the repulsion at large distances from the surface (starting at ∼100 nm, diffuse layer) and followed by an attraction when the tip is immersed in the inner layer (∼10 nm). The calculated dielectric constant as a function of the distance to the charged interface obtained by fitting the force versus distance curves, allows the mapping of the inner layer dielectric constant profiles with a nanometer resolution.
  • Journal title
    Chemical Physics Letters
  • Serial Year
    2000
  • Journal title
    Chemical Physics Letters
  • Record number

    1772843