Title of article
Interfacial aqueous solutions dielectric constant measurements using atomic force microscopy
Author/Authors
Teschke، نويسنده , , O. and Ceotto، نويسنده , , G. and de Souza، نويسنده , , E.F.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
7
From page
328
To page
334
Abstract
The exchange of the volume of a region of the electric double layer of a mica surface immersed in aqueous solutions, with a dielectric constant ϵDL, by a nanosized radius tip, with a dielectric constant ϵTip, is responsible for the repulsion at large distances from the surface (starting at ∼100 nm, diffuse layer) and followed by an attraction when the tip is immersed in the inner layer (∼10 nm). The calculated dielectric constant as a function of the distance to the charged interface obtained by fitting the force versus distance curves, allows the mapping of the inner layer dielectric constant profiles with a nanometer resolution.
Journal title
Chemical Physics Letters
Serial Year
2000
Journal title
Chemical Physics Letters
Record number
1772843
Link To Document