Title of article :
A theoretical study of the reaction of SiH2 with C2H2 and C2D2
Author/Authors :
Tho Nguyen، نويسنده , , Minh and Sengupta، نويسنده , , Debasis and Vanquickenborne، نويسنده , , L.G.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1995
Pages :
8
From page :
513
To page :
520
Abstract :
Potential energy surfaces of the reaction of SiH2 and C2H2 (and C2D2) have been calculated by means of ab initio molecular orbital theory at the QCISD/6-311G++(2df, 2p)//MP2/6-31G(d, p) level with corrections for the triple excitations to the QCISD energies. The barrier heights for the two reaction channels of the adduct, thus calculated, were further utilized for the dynamical calculation of the rate constants in the framework of quantum statistical Rice-Ramsperger-Kassel theory. Contributions of the rate constants of the various pathways to the total rate constant (KT) for the disappearance of the reactants are critically examined and compared with experiment. The pressure dependence of KT(C2H2) is primarily due to the formation of silirene. KT(C2D2) is consistently higher than KT(C2H2). The standard heat of formation of silirene is predicted to be 72.1 ± 3 kcal/mol. Rearrangement of silirene to vinylsilylene requires an activation energy smaller than that to silylacetylene.
Journal title :
Chemical Physics Letters
Serial Year :
1995
Journal title :
Chemical Physics Letters
Record number :
1774212
Link To Document :
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