Author/Authors :
Wu، نويسنده , , Z. and Ehrlich، نويسنده , , S.N. and Matthies، نويسنده , , B. and Herwig، نويسنده , , K.W. and Dai، نويسنده , , Pengcheng and Volkmann، نويسنده , , U.G. and Hansen، نويسنده , , F.Y. and Taub، نويسنده , , H.، نويسنده ,
Abstract :
The structure and growth mode of alkane films (n-CnH2n+2; n=4, 6, 7) adsorbed on a Ag(1 1 1) surface have been investigated by synchrotron X-ray scattering. New models are proposed for the butane (n=4) and hexane (n=6) monolayer and butane bilayer structures. Specular reflectivity scans reveal that growth of all films is preempted between two and three layers by nucleation of bulk particles oriented with a single bulk crystal plane parallel to the film. In the case of butane, the bulk particles also have a fixed azimuthal relationship with the film resulting in complete epitaxy.
