Author/Authors :
Kasprowicz، نويسنده , , M.J. and Dohnalik، نويسنده , , T. and Jozefowski، نويسنده , , L. and Rubahn، نويسنده , , K. and Rubahn، نويسنده , , H.-G.، نويسنده ,
Abstract :
The diffusion coefficient for rubidium in poly-(dimethylsiloxane) thin films has been determined via pulsed laser depletion and cw laser time-of-flight detection of desorbing atoms. The value of the diffusion coefficient of 1.2 ± 0.7 × 10−5 cm2/s agrees with a theoretical estimate and is an important quantity for a quantitative understanding of dynamic light-induced atom desorption.
