XPS and AFM characterisation of selective monolayers for cationic detection: application to field effect chemical micro-sensors

X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) have been used to investigate physico-chemical properties of mixed Langmuir-films made of carboxylic ionophores and phospholipids. The selective monolayers were deposited onto semiconductor structures. Differences found in various experiments of friction force corresponded well with those found from XPS spectra. The cation detection by the monolayer was also proved by XPS studies and confirmed by significative sensitivities found with functionalised ion-sensitive field effect transistors (ISFETs).