Title of article
Spectroscopic ellipsometry study of Ir(ppy)3 organic light emitting diode
Author/Authors
Nabatova-Gabain، نويسنده , , Nataliya and Wasai، نويسنده , , Yoko and Tsuboi، نويسنده , , Taiju، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2006
Pages
6
From page
833
To page
838
Abstract
We studied the optical properties of fac tris(2-phenylpyridine) iridium (Ir(ppy)3) emitting layer in single-layer organic light emitting diode (OLED) device and in thin film grown on quartz plate using a phase modulated spectroscopic ellipsometry (PMSE). Accurate spectra of refractive index n and extinction coefficient k of Ir(ppy)3 were obtained in the wavelength range of 330–830 nm in the device and film. Difference was observed in the n and k spectra between the single layer thin film evaporated on quartz plate and OLED. Additionally difference was found between the layer thickness estimated by quartz oscillator and thickness estimated from the PMSE measurement.
Keywords
Organic light emitting diodes , spectroscopic ellipsometry , Optical constants , Ir(ppy)3 , Layer thickness
Journal title
Current Applied Physics
Serial Year
2006
Journal title
Current Applied Physics
Record number
1785340
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