Title of article :
The structure of vitreous P2O5 studied by high-energy X-ray diffraction
Author/Authors :
Hoppe، نويسنده , , U and Kranold، نويسنده , , R and Barz، نويسنده , , A and Stachel، نويسنده , , D and Neuefeind، نويسنده , , J، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
4
From page :
559
To page :
562
Abstract :
Diffraction of hard X-rays (140 kV) has been used to determine the structure of vitreous P2O5. The new data obtained at a wiggler beamline of a synchrotron augment earlier neutron- and Ag Kα X-ray data. The new X-ray correlation function reveals two lengths of P–O bonds (143.2±0.5 and 158.1±0.3 pm) and a clear peak of P–P distances at 294.2±0.5 pm. A mean angle of 137° is calculated for the P–O–P bridges.
Keywords :
E. Synchrotron radiation , C. X-ray scattering , A. Disordered systems
Journal title :
Solid State Communications
Serial Year :
2000
Journal title :
Solid State Communications
Record number :
1785854
Link To Document :
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