Title of article :
Electrical characteristics and efficiency of organic light-emitting diodes depending on hole-injection layer
Author/Authors :
Lee، نويسنده , , David Y.H. and Kim، نويسنده , , W.J. and Kim، نويسنده , , T.Y. and Jung، نويسنده , , J. and Lee، نويسنده , , J.Y. and Park، نويسنده , , H.D. and Kim، نويسنده , , T.W. and Hong، نويسنده , , J.W.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2007
Pages :
4
From page :
409
To page :
412
Abstract :
In a device structure of ITO/hole-injection layer/N,N′-biphenyl-N,N′-bis-(1-naphenyl)-[1,1′-biphthyl]4,4′-diamine(NPB)/tris(8-hydroxyquinoline)aluminum(Alq3)/Al, we investigated the effect of the hole-injection layer on the electrical characteristics and external quantum efficiency of organic light-emitting diodes. Thermal evaporation was performed to make a thickness of NPB layer with a rate of 0.5–1.0 Å/s at a base pressure of 5 × 10−6 Torr. We measured current–voltage characteristics and external quantum efficiency with a thickness variation of the hole-injection layer. CuPc and PVK buffer layers improve the performance of the device in several aspects, such as good mechanical junction, reducing the operating voltage, and energy band adjustment. Compared with devices without a hole-injection layer, we found that the optimal thickness of NPB was 20 nm in the device structure of ITO/NPB/Alq3/Al. By using a CuPc or PVK buffer layer, the external quantum efficiencies of the devices were improved by 28.9% and 51.3%, respectively.
Keywords :
external quantum efficiency , Hole-injection layer , Organic light emitting diode , Buffer layer , luminance
Journal title :
Current Applied Physics
Serial Year :
2007
Journal title :
Current Applied Physics
Record number :
1785906
Link To Document :
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