Title of article :
Cluster-assembled carbon films with different nanostructures: a spectroscopic study
Author/Authors :
Riedo، نويسنده , , E and Magnano، نويسنده , , E and Rubini، نويسنده , , S and Sancrotti، نويسنده , , M and Barborini، نويسنده , , E and Piseri، نويسنده , , P and Milani، نويسنده , , P، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
Carbon thin films with different nanostructures grown by Cluster Beam Deposition are studied by means of Raman Spectroscopy, X-ray photoemission spectroscopy (XPS), and electron energy loss spectroscopy (EELS). Raman and EELS of the as-grown specimens show a correlation between the properties of the free carbon clusters and the properties of the films obtained by deposition of different sized clusters. In contrast, the inhomogeneous character of the films is not reflected in the valence band states as seen by XPS.
Keywords :
A. Thin films , A. Nanostructures , D. Electronic states , E. Photoelectron spectroscopies , E. Electron energy loss spectroscopy
Journal title :
Solid State Communications
Journal title :
Solid State Communications
