• Title of article

    Evidence of photoluminescence related to subsurface Si–O–Si bonds in sputtered silicon nanoparticles

  • Author/Authors

    Zhu، نويسنده , , Y and Wang، نويسنده , , H and Ong، نويسنده , , P.P، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    3
  • From page
    427
  • To page
    429
  • Abstract
    We have prepared silicon nanoparticles by depositing the dc sputtered Si material on the cooled surface of a liquid-nitrogen-cooled trap. The photoluminescence in the region of 300–550 nm is found to be independent of the surface chemical structure of the particles. FTIR investigations suggest that the photoluminescence peak is related to the Si–O–Si bonds whose stretching vibration wavenumber is about 1080 cm−1. The results show a definite correspondence between the photoluminescence intensities and the 1080 cm−1 FTIR peaks for the different annealed samples. Moreover, this 1080 cm−1 FTIR vibration species arises not from the surface layer but from the deeper subsurface layer of the particles, which explains why the photoluminescence is stable and fairly independent of the oxidation of the surface Si bonds through aging or annealing in the atmosphere.
  • Keywords
    D. Luminescence , C. Infrared spectroscopy , A. Nanostructures , A. Semiconductors
  • Journal title
    Solid State Communications
  • Serial Year
    2000
  • Journal title
    Solid State Communications
  • Record number

    1786186