Title of article :
EPR-study of nitrogen implanted silicon nitride
Author/Authors :
Shames، نويسنده , , A.I. and Gritsenko، نويسنده , , V.A. and Samoilova، نويسنده , , R.I. and Tzvetkov، نويسنده , , Yu.D. and Braginsky، نويسنده , , L.S. and Roger، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
Electrons and holes localized in amorphous silicon nitride (Si3N4) were studied by electron paramagnetic resonance (EPR). No EPR signals due to localized charges were observed in charged samples, containing high density of traps — almost stoichiometric Si3N4. N-implanted Si3N4 samples, characterized by a lower density of traps, also showed no corresponding EPR signals. The possible pairing of charges due to antiferromagnetic exchange interactions arising from resonant quantum tunneling has been proposed to explain the absence of signals in samples with high density of traps. We briefly describe various models of spin-pairing including a Wigner glass of bipolarons, with a pair of charges trapped at neighboring traps, and discuss them in connection with the experimental data.
Keywords :
D. Exchange and superexchange , E. Electron paramagnetic resonance , A. Semiconductors
Journal title :
Solid State Communications
Journal title :
Solid State Communications