Title of article
Measurements of insulator band parameters using combination of single-electron and two-electron spectroscopy
Author/Authors
Samarin، نويسنده , , S. A. Artamonov and V. R. Shaginyan ، نويسنده , , O.M. and Suvorova، نويسنده , , A.A. and Sergeant، نويسنده , , A.D. and Williams، نويسنده , , J.F.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
389
To page
393
Abstract
We describe the application of low energy time-of-flight coincidence (e,2e) spectroscopy for measurements of the energy band parameters of a dielectric. The (e,2e) spectrometer can operate also in a single-electron mode by switching off coincidence conditions, and can be used for recording electron energy loss spectra (EELS). Thus, the combination of (e,2e) and EELS allows the measurement of energy gap Eg, valence bandwidth ΔEval, electron affinity χ and excitonic levels position Eex of a dielectric. The energy band parameters of LiF film deposited on Si(001) surface are measured: Eg=(13.0±0.4) eV, ΔEval= (6.0±0.5) eV, Eex=(10.0±0.4) eV, χ=(1.0±0.4) eV.
Keywords
D. Dielectric , D. Energy band parameters , E. Electron spectroscopy
Journal title
Solid State Communications
Serial Year
2004
Journal title
Solid State Communications
Record number
1788615
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