• Title of article

    Investigation of structural phase transition in polycrystalline SrTiO3 thin films by Raman spectroscopy

  • Author/Authors

    Du، نويسنده , , Samuel Y.L. and Chen، نويسنده , , G. and Zhang، نويسنده , , M.S.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    4
  • From page
    577
  • To page
    580
  • Abstract
    Polycrystalline SrTiO3 thin films were prepared by pulsed laser deposition technique. The phonon properties and structural phase transition were studied by Raman spectroscopy. The first-order Raman scattering, which is forbidden in SrTiO3 single crystal, has been observed in the films, due to the structural distortion caused by strain effect and oxygen vacancies. The Fano-type line shape of TO2 phonon reveals the existence of polar microregions in the STO thin films. The evolution of TO2 and TO3 phonons with temperature shows the occurrence of a structural phase transition at 120 K related to the formation of polar macroregions in the films.
  • Keywords
    A. Thin films , B. Laser processing , D. phonons , D. Phase transitions
  • Journal title
    Solid State Communications
  • Serial Year
    2004
  • Journal title
    Solid State Communications
  • Record number

    1788899