Microstructures and microwave dielectric properties of La1-xBx(Mg0.5Sn0.5)O3 ceramics

The microwave dielectric properties of La1-xBx(Mg0.5Sn0.5)O3 ceramics were examined with a view to their exploitation for mobile communication. The La1-xBx(Mg0.5Sn0.5)O3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the La0.995B0.005(Mg0.5Sn0.5)O3 ceramics revealed no significant variation of phase with sintering temperatures. A maximum apparent density of 6.58 g/cm3, a dielectric constant (εr) of 19.8, a quality factor (Q × f) of 41,800 GHz, and a temperature coefficient of resonant frequency (τf) of −86 ppm/°C were obtained for La0.995B0.005(Mg0.5Sn0.5)O3 ceramics that were sintered at 1500 °C for 4 h.