Title of article :
Pressure-induced phase transitions in Si observed by thermoelectric power measurements
Author/Authors :
Ovsyannikov، نويسنده , , Sergey V. and Shchennikov، نويسنده , , Vladimir V. and Misiuk، نويسنده , , Andrzej and Shchennikov Jr، نويسنده , , Vsevolod V.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
For the first time the phase transitions under high pressure P up to 20 GPa have been observed in Czochralski-grown Si single crystals by thermoelectric power S measurements. Values of S≈+8±3 μV/K have been determined for tetragonal, orthorhombic and simple hexagonal high-pressure phases. The behaviour of S(P) was found to be rather different for different Si samples—initial and pre-treated by high temperatures 450–650 °C under hydrostatic pressure 0–1.5 GPa.
Keywords :
72.20.Pa , A. Semiconductors , 05.70.fh , D. Phase transitions , D. Electronic transport , E. High pressure , 81.40.Vw
Journal title :
Solid State Communications
Journal title :
Solid State Communications