Anomalous PL brightening caused by partial Auger recombination of a (D0, X) complex during an impact ionization avalanche in n-GaAs

Partial Auger recombination of the (D0, X) bound-exciton in n-GaAs at 4.2 K during an impact ionization avalanche under an applied pulse voltage has been investigated. The bright photoluminescence (PL)-pattern observed by applying the pulse voltage, characterizes well the formation of a current density filament. The observation of the bright PL spectra inside the current density filament gives a quite new result concerning the partial Auger recombination process of the (D0, X) complex, leaving the neutral donor in the excited states.