Title of article :
Temperature dependence of absorption edge anisotropy in 2H- MoSe2 layered semiconductors
Author/Authors :
Hu، نويسنده , , S.Y. and Lee، نويسنده , , Catherine Y.C and Shen، نويسنده , , J.L. and Chen، نويسنده , , K.W. and Tiong، نويسنده , , K.K and Huang، نويسنده , , Y.S.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
5
From page :
176
To page :
180
Abstract :
The absorption-edge anisotropy of 2H- MoSe2 was studied by photoconductivity (PC) measurements as a function of temperature in the range of 12–300 K. A significant shift towards lower energies has been observed in the PC spectra on the edge plane with respect to those corresponding to the van der Waals (VdW) plane. The parameters that describe the temperature dependence of the absorption edges are evaluated by the Bose–Einstein empirical expression. Effective phonon energy was estimated from the temperature dependence of the Urbach energy. The estimated effective phonon energy for the VdW and edge planes, respectively, can be correlated to the observed Raman active E 1g and A 1g modes.
Keywords :
D. Photoconductivity , A. Semiconductors
Journal title :
Solid State Communications
Serial Year :
2006
Journal title :
Solid State Communications
Record number :
1790921
Link To Document :
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