Author/Authors :
Hwang، نويسنده , , B. and Kwon، نويسنده , , J. and Lee، نويسنده , , M. and Lim، نويسنده , , S.J. and Jeon، نويسنده , , S. and Kim، نويسنده , , S. and Ham، نويسنده , , U. and Song، نويسنده , , Y.J. and Kuk، نويسنده , , Y.، نويسنده ,
Abstract :
It has been known that a good quality h-BN layer can only be grown within a narrow temperature window of 1020–1100 K on a copper substrate. We found that the growth temperature window on Cu(111) surface could be lowered up to 100 K by ionizing and/or exciting borazine precursor gas with an electron-beam. The structures of a hexagonal boron nitride (h-BN) layers grown at various substrate temperatures on a Cu(111) were examined using scanning tunneling microscopy. We found that the grown h-BN film exhibits highly inert behavior with wide bandgap semiconductor characteristics.
Keywords :
Borazine , Electron-beam , Scanning tunneling microscopy , hexagonal boron nitride