Title of article :
Characterization of Cd1−xFexS diluted magnetic semiconductors grown at near phase conversion temperature
Author/Authors :
Wu، نويسنده , , X.J. and Shen، نويسنده , , D.Z. and Zhang، نويسنده , , Z.Z. and Liu، نويسنده , , K.W. and Li، نويسنده , , B.H. and Zhang، نويسنده , , J.Y. and Lu، نويسنده , , Y.M. and Zhao، نويسنده , , D.X. and Yao، نويسنده , , Bin B. and Ren، نويسنده , , X.G. and Fan، نويسنده , , X.W.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
4
From page :
344
To page :
347
Abstract :
Fe-based cadmium sulfide alloy thin films have been grown on c -plane sapphire substrates by a low-pressure metalorganic chemical vapor deposition technique at different growth temperatures. From X-ray diffraction and absorption spectra of the samples, the evolutions with growth temperature show an inflexion at the growth temperature of 300 ∘C. This was attributed to the phase transformation from zinc-blende to wurtzite. With increasing growth temperature from 270 ∘C to 360 ∘C, Fe concentration in the films increases monotonously. The electronic states of Cd1−xFexS were investigated by X-ray photoelectron spectroscopy. Magnetic measurement shows Van Vleck paramagnetism of the Cd1−xFexS thin film in the temperature region below 7 K.
Keywords :
D. Van Vleck-type paramagnetism , A. Cd1?xFexS , D. Phase conversion
Journal title :
Solid State Communications
Serial Year :
2007
Journal title :
Solid State Communications
Record number :
1791288
Link To Document :
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