Title of article :
Electrical properties and stability of Tb-doped zinc oxide-based nonlinear resistors
Author/Authors :
Nahm، نويسنده , , C.-W.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Abstract :
The microstructure, electric field–current density ( E – J ), capacitance–voltage ( C – V ), and stability characteristics of Zn–Pr–Co–Cr–Tb oxide-based nonlinear resistors were investigated for different Tb4O7 amounts. It increased in the range of 8.9–42.0 in the nonlinear coefficient and in the range of 1026–6514 V/cm in the breakdown field with increasing Tb4O7 amount. As Tb4O7 amount increased, the donor density decreased in the range of 1.23×1018–0.70×1018/cm3, whereas the barrier height at grain boundaries increased in the range of 0.73–0.93 eV. A good stability was obtained in the range of 0.25–0.5 mol% in Tb4O7 amount.
Keywords :
A. Semiconductors , D. ZnO-based nonlinear resistors , C. Grain boundaries , D. Electrical properties
Journal title :
Solid State Communications
Journal title :
Solid State Communications