Title of article :
Transport behaviors and mechanisms in cuspidal blockade region for silicon single-hole transistor
Author/Authors :
Lee، نويسنده , , Youngmin and Lee، نويسنده , , Sejoon and Hiramoto، نويسنده , , Toshiro، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2014
Pages :
5
From page :
428
To page :
432
Abstract :
The Si single-hole transistor displays the anomalously-extended cuspidal blockade region, which is elongated toward the 45°-tilted direction normal to gate vs. drain bias voltage regions in the Coulomb blockade diagram. This is attributed to the formation of an ultra small Si quantum dot (QD) into the gate-all-around (GAA) stack. Namely, the large one-electron-addition energy (= 447 meV) from the 2-nm-size Si QD enables the clear Coulomb-blockade events at room temperature, and the large voltage gain from the GAA stack allows the cuspidal extension of the blockade region through the renormalization of Coulomb-blockade energies at the adjacent bias points near the initial Coulomb-blockade state.
Keywords :
Silicon single-hole transistor , Extended blockade regime , Room temperature operation , Coulomb blockade oscillation , Negative differential conductance
Journal title :
Current Applied Physics
Serial Year :
2014
Journal title :
Current Applied Physics
Record number :
1791851
Link To Document :
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