In-situ X-ray microdiffraction analysis of local strain-field across the interface in a Pb(Zr0.52Ti0.48)O3/Ni0.8Zn0.2Fe2O4/Pb(Zr0.52Ti0.48)O3 tri-layered structure

We have performed a synchrotron X-ray microdiffraction to investigate the variation of the local strain-field across the interface in Pb(Zr0.52Ti0.48)O3/Ni0.8Zn0.2Fe2O4/Pb(Zr0.52Ti0.48)O3 (PZT–NZFO–PZT) tri-layered structure. In this study, we show that the in-plane lattice parameters of the NZFO lattice depend strongly on the piezoelectric strain of the PZT layer. This result explains that an electric-field-induced piezoelectric strain from the PZT layer is effectively transferred to the NZFO layer. Furthermore, the local strain persists within 20 μm away from the interface, inducing changes of magnetic responses via the inverse magnetostrictive effect.