Title of article :
van der Waals interaction in systems involving oxidised polystyrene surfaces
Author/Authors :
Lubarsky، نويسنده , , G.V. and Mitchell، نويسنده , , S.A and Davidson، نويسنده , , M.R. and Bradley، نويسنده , , R.H.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
8
From page :
188
To page :
195
Abstract :
The forces between polystyrene surfaces and silicon nitride or spherical silica probes in nitrogen and water have been measured using an atomic force microscope. The polystyrene surfaces were modified using a UV–ozone treatment which increased surface oxygen levels incrementally from 0 to 26 at.%. The Hamaker constant was determined for each system of probe/media and surface as a function of surface oxygen concentration. For each system involving untreated polystyrene, the measured Hamaker constant agreed well with that calculated using the Lifshitz theory. Fundamental material properties of the UV–ozone-treated surfaces were then obtained from the measured values of the Hamaker constant. Results obtained from three different probe/media/surface systems show a 15–45% reduction of refractive index and a 2–3% reduction of the dielectric permittivity with increasing surface oxygen concentration. This method of surface characterisation allowed the determination of refractive index and static dielectric permittivity with submicron resolution.
Keywords :
van der Waals force , Hamaker constant , polystyrene , Dielectric Permittivity , Refractive index , AFM
Journal title :
Colloids and Surfaces A Physicochemical and Engineering Aspects
Serial Year :
2006
Journal title :
Colloids and Surfaces A Physicochemical and Engineering Aspects
Record number :
1792243
Link To Document :
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