Title of article :
Thickness dependence of positive exchange bias in ferromagnetic/antiferromagnetic bilayers
Author/Authors :
Xu، نويسنده , , Xiaoyong and Gao، نويسنده , , Yu-Jie and Wang، نويسنده , , Yei-Li and Hu، نويسنده , , Jing-Guo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Pages :
4
From page :
952
To page :
955
Abstract :
For the ferromagnetic (FM)/antiferromagnetic (AFM) bilayers, both negative and positive exchange bias H E have been observed for low and high cooling field H C F , respectively. The thickness dependence of H E and coercivity H C have been investigated for the cases of negative and positive H E . It is found that the negative H E and the positive one have similar FM thickness dependence that is attributed to the interfacial nature of exchange bias. However, the AFM thickness dependence of positive H E is completely contrary to that of the negative one, which clearly demonstrates that the AFM spins play different roles for the cases of positive and negative H E . In particular, the AFM thickness of positive H E was first highlighted by an AFM spin canting model. These results should be attributed to the interfacial spin configuration after field cooling procedure.
Keywords :
A. FM/AFM bilayers , C. Spin configuration , D. Exchange bias
Journal title :
Solid State Communications
Serial Year :
2011
Journal title :
Solid State Communications
Record number :
1792482
Link To Document :
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