Author/Authors :
Mostafa، نويسنده , , K.M. and Gonzalez Camara، نويسنده , , Nikita F. and Petrov، نويسنده , , Roumen and Rodriguez Calvillo، نويسنده , , P. and De Baerdemaeker، نويسنده , , J. and De Grave، نويسنده , , E. and Segers، نويسنده , , D. and Houbaert، نويسنده , , Y.، نويسنده ,
Abstract :
A series of FeSi samples were deformed to a thickness reduction of 16%. They were isochronally annealed for one hour at different temperatures and characterized by the Doppler broadening of the annihilation radiation (DBAR) measured at room temperature. Optical microscopy (OM) is used to investigate the microstructure of the deformed samples before and after annealing. The S parameter data show a decrease with the increase of the annealing temperature. At 973 K a significant decrease sets in. The microstructures of the alloys, investigated by OM, show that recrystallization is completed at 1173 K.
Keywords :
A. FeSi Electrical Steel , D. Annealing , E. Positron annihilation spectroscopy , E. Light optical microscopy
