Spin domain mapping of a CrO2 thin film using spin-polarized current microscopy

We investigate spin domain mapping of a CrO2 thin film using spin-polarized current microscopy at room temperature, where conductive atomic force microscopy (CAFM) with a CrO2-coated tip is used. The nanoscale spin domains of the CrO2 thin film were crosschecked by magnetic force microscopy (MFM). Notably, the CAFM exhibits the spin domains of the CrO2 thin film with higher resolution than the MFM, which may result from a local point contact between the nanoscale CrO2-coated tip and surface of the CrO2 thin film.