Title of article
Energy band alignment of MgO (111)/ZnO (0002) heterojunction determined by X-ray photoelectron spectroscopy
Author/Authors
Shi، نويسنده , , K. and Zhang، نويسنده , , P.F. and Wei، نويسنده , , H.Y. and Jiao، نويسنده , , C.M. and Li، نويسنده , , C.M. and Liu، نويسنده , , X.L. and Yang، نويسنده , , S.Y. and Zhu، نويسنده , , Q.S. and Wang، نويسنده , , Z.G.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2012
Pages
3
From page
938
To page
940
Abstract
X-ray photoelectron spectroscopy (XPS) was used to measure the energy discontinuity in the MgO (111)/ZnO (0002) heterostructure. The valence band offset (VBO) was determined to be 1.22±0.23 eV and a type-I heterojunction with a conduction band offset (CBO) of 3.24±0.23 eV was obtained. The discrepancy of VBO values between MgO/ZnO and ZnO/MgO heterojunctions was mainly attributed to the internal electric field induced by spontaneous polarization effect in ZnO layer.
Keywords
E. Photoelectron spectroscopy , A. ZnO , A. MgO , D. Polarization effect
Journal title
Solid State Communications
Serial Year
2012
Journal title
Solid State Communications
Record number
1793290
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