Issues with characterizing transport properties of graphene field effect transistors

The transport properties of graphene field effect transistors are typically characterized using a conventional test structure consisting of graphene on silicon dioxide with deposited metal contacts. Two of the primary parameters affecting the total resistance of this structure are the channel mobility and contact resistance. A simple model is used to describe the impact of these parameters on total device resistance and experimentally extract them. Important issues related to characterizing the transport properties of graphene field effect transistors are presented and discussed.