Title of article :
Oxygen diffusion across the grain boundary in bicrystal yttria stabilized zirconia
Author/Authors :
Park، نويسنده , , Joong Sun and Kim، نويسنده , , Young-Beom and An، نويسنده , , Jihwan and Prinz، نويسنده , , Fritz B.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
3
From page :
2169
To page :
2171
Abstract :
Electrochemical impedance spectroscopy (EIS) measurements in yttria stabilized zirconia (YSZ) with a single Σ13(510)/[001] grain boundary in a common SOFC electrolyte showed that oxide ion diffusion is blocked when it jumps across the grain boundary at operating temperatures between 300 and 525 °C. The EIS results are supported by secondary ion mass spectrometry (SIMS) measurements combined with oxygen isotope annealing on the bicrystal YSZ. The SIMS results showed that the 18O/16O+18O ratio dropped sharply near the grain boundary regions.
Keywords :
A. Oxide ion conducting ceramic , C. Bi-crystal structure , D. Ionic conduction thorough grain boundary , E. EIS and SIMS.
Journal title :
Solid State Communications
Serial Year :
2012
Journal title :
Solid State Communications
Record number :
1793821
Link To Document :
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