Title of article :
Polarization-dependent ARPES measurement for valence band of anatase TiO2
Author/Authors :
Emori، نويسنده , , Masato and Sakino، نويسنده , , Akiko and Ozawa، نويسنده , , Kenichi and Sakama، نويسنده , , Hiroshi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
4
From page :
15
To page :
18
Abstract :
Angle-resolved photoelectron spectroscopy utilizing linearly polarized synchrotron radiation was conducted to examine the electronic structure of an anatase TiO2(001) thin film fabricated on LaAlO3(100) by pulsed laser deposition. Polarization-dependent measurements by changing the incidence angle of the light were performed to identify the orbital symmetry. Energy–momentum dispersion curves along the [001] direction are mapped and resolved into four components: O 2p-derived Pπ non-bonding, O 2p–Ti 3d σ bonding, and two π bonding states. The intensities of the π bonding states are obviously different between both polarizations while the intensities of the peaks due to Pπ and σ are almost equivalent. Two different π states with polarization dependence were attributed to Ti t1u π orbital. The result implies that the distortion of TiO6 octahedra resolves degeneracy of T1u bands and/or breaking T2g symmetry.
Keywords :
A. Semiconductors , C. Crystal structure and symmetry , D. Electronic band structure , E. Photoelectron spectroscopies
Journal title :
Solid State Communications
Serial Year :
2014
Journal title :
Solid State Communications
Record number :
1794855
Link To Document :
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