Title of article :
Influence of carbon content on the crystallographic structure of boron carbide films
Author/Authors :
Conde، نويسنده , , O and Silvestre، نويسنده , , Philip A.J. and Oliveira، نويسنده , , J.C، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
141
To page :
146
Abstract :
Boron carbide thin films were synthesised by laser-assisted chemical vapour deposition (LCVD), using a CO2 laser beam and boron trichloride and methane as precursors. Boron and carbon contents were measured by electron probe microanalysis (EPMA). Microstructural analysis was carried out by Raman microspectroscopy and glancing-incidence X-ray diffraction (GIXRD) was used to study the crystallographic structure and to determine the lattice parameters of the polycrystalline films. The rhombohedral–hexagonal boron carbide crystal lattice constants were plotted as a function of the carbon content, and the non-linear behaviour observed was interpreted on the basis of the complex structure of boron carbide.
Keywords :
Boron Carbide , Micro-Raman spectroscopy , Laser CVD , Crystallographic structure
Journal title :
Surface and Coatings Technology
Serial Year :
2000
Journal title :
Surface and Coatings Technology
Record number :
1798624
Link To Document :
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