• Title of article

    Ion current analysis in pulsed RF plasma as a fundamental research of plasma-based ion implantation

  • Author/Authors

    Tenno، نويسنده , , N and Yukimura، نويسنده , , K and Masamune، نويسنده , , S، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    5
  • From page
    127
  • To page
    131
  • Abstract
    Analysis of the target current in plasma-based ion implantation (PBII) has been performed using a simple equivalent circuit model. It was found that a current for charging the stray capacitance dominates the initial phase of the voltage pulse. The target voltage decay after turning off the power supply depends on the sheath impedance and the stray capacitance as well. It is therefore very important to reduce the stray capacitance in order to suppress unfavorable effects, such as sputtering with low energy ions.
  • Keywords
    Plasma-based ion implantation (PBII) , Ion current analysis , Stray capacitance
  • Journal title
    Surface and Coatings Technology
  • Serial Year
    2001
  • Journal title
    Surface and Coatings Technology
  • Record number

    1800646