Author/Authors :
Current، نويسنده , , Michael I and Liu، نويسنده , , Wei and Roth، نويسنده , , Ian S and Lamm، نويسنده , , Albert J and En، نويسنده , , William G and Malik، نويسنده , , Igor J and Feng، نويسنده , , Lucia and Bryan، نويسنده , , Michael A and Qin، نويسنده , , Shu and Henley، نويسنده , , Francois J and Chan، نويسنده , , Chung-Yu Cheung، نويسنده , , Nathan W، نويسنده ,
Abstract :
A plasma immersion ion implantation (PIII) system is described which provides the capability to bridge the range between research exploration and commercial applications for materials modification of electronic materials, with a particular focus on layer transfer processes. The Silicon Genesis PIII system is capable of operation at high plasma densities (≈5×1011 ions/cm3 at the wafer) with high purity, mono-species ionization (>99% H+ ions with a hydrogen plasma). The first generation of Silicon Genesis PIII systems is equipped to use 200-mm wafers (through an automated loadlock) and pulsed potentials up to 50 kV. Use of the mono-species ionization characteristic of the Silicon Genesis PIII system provides the capability to precisely vary the characteristics of surface layers through implantation of atoms and damage creation at well-controlled depths in the materials of choice. The Silicon Genesis PIII system is designed for efficient production of SOI and other layer transfer-generated materials and can be adapted for materials modification of more complex structures and work pieces.
Keywords :
Silicon-on-insulator wafers , Protonic mode , Plasma immersion ion implantation , Hydrogen plasma , Layer transfer