Title of article
Spectroscopic ellipsometry studies of HgI2 surface roughness effects and optical properties of [KHgI3, H2O]
Author/Authors
A. En Naciri، نويسنده , , A. and Johann، نويسنده , , L. and Broch، نويسنده , , L. and Sieskind، نويسنده , , M. and Amann، نويسنده , , M.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
5
From page
294
To page
298
Abstract
Below the energy-band absorption edge (∼2.2 eV), the ordinary and extraordinary refractive indices of the film formed on a HgI2 substrate after 30 h exposure to air were found to follow the first-order Cauchy dispersion relationship nof=1.401+0.052/λ2 and nef=1.575+0.043/λ2 in the spectral range from 300 to 800 nm. The characteristics of the complex [KHgI3, H2O] formed on the HgI2 surface after potassium iodide (KI) etching have been investigated by taking into account the surface roughness.
Keywords
Surface roughness , HgI2 , I , H2O] , ellipsometry
Journal title
Surface and Coatings Technology
Serial Year
2002
Journal title
Surface and Coatings Technology
Record number
1803350
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