Title of article
Nanoscale electric modification and observation of sputtered carbon films by atomic force microscopy with conductive tip
Author/Authors
Tajima، نويسنده , , H. and Shimada، نويسنده , , T. and Sawasaki، نويسنده , , K. and Umemura، نويسنده , , S. and Hirono، نويسنده , , S. and Tsuchitani، نويسنده , , S. and Kaneko، نويسنده , , R.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
3
From page
208
To page
210
Abstract
SPM-based techniques have many applications, such as in the area of high-density data storage. This paper describes our use of an SPM-based read/write technique in which AFM is used to electrically modify the surface of a sputtered carbon film, and electric conductivity imaging of the modification marks is performed with a conductive tip.
Keywords
carbon , diamond , Conductivity , Atomic force microscopy (AFM) , modification
Journal title
Surface and Coatings Technology
Serial Year
2003
Journal title
Surface and Coatings Technology
Record number
1805602
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