Comparison of diluent gas effect on the growth behavior of horizontal CVD SiC with analytical and experimental data

Silicon carbide films were produced through a low pressure CVD process in a horizontal hot wall deposition system. The computational simulation of gas velocity, temperature profile and pressure in the reaction chamber were conducted with varying process variables (i.e. temperature and dilute gas addition). The simulated results were adapted to the experimental results. The model showed the reasons for microstructural and growth rate variations of SiC film with temperature and diluent gas. All simulation results had important connections with temperatures, which had an effect on the growth atmosphere of the system.