Title of article :
Effects of Al contents on microstructures of Cr1−XAlXN and Zr1−XAlXN films synthesized by cathodic arc method
Author/Authors :
Hasegawa، نويسنده , , Hiroyuki and Kawate، نويسنده , , Masahiro and Suzuki، نويسنده , , Tetsuya، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
5
From page :
2409
To page :
2413
Abstract :
Cr1−XAlXN and Zr1−XAlXN (0≤×≤1.0) films were synthesized by the cathodic arc method using alloy and metal targets. The X-ray diffraction patterns showed that the Cr1−XAlXN changed from cubic structure at X=0.6 to hexagonal structure at X=0.7. The peaks of Zr1−XAlXN showed the NaCl structure at X=0.37 and changed to wurtzite structure at X=0.50. The lattice parameter of Cr1−XAlXN films changed from 0.416 nm (X=0) to 0.413 nm (X=1.0), and that of Zr1−XAlXN changed from 0.458 nm (X=0) to 0.444 nm (X=0.37). The maximum microhardness of Cr1−XAlXN and Zr1−XAlXN films was 27 GPa (X=0.6) and 29 GPa (X=0.37), respectively. Changes in microstructures-related transition from the cubic to hexagonal were studied, and corresponding hardness changes were discussed in Cr1−XAlXN and Zr1−XAlXN.
Keywords :
Cr1?XAlXN , microstructure , Zr1?XAlXN , Microhardness
Journal title :
Surface and Coatings Technology
Serial Year :
2005
Journal title :
Surface and Coatings Technology
Record number :
1810673
Link To Document :
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