Title of article :
Top-emitting organic light-emitting diode using transparent conducting indium oxide layer fabricated by a two-step ion beam-assisted deposition
Author/Authors :
Lim، نويسنده , , J.T. and Jeong، نويسنده , , C.H. and Vozny، نويسنده , , A. and Lee، نويسنده , , J.H. and Kim، نويسنده , , M.S. and Yeom، نويسنده , , G.Y.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
5
From page :
5358
To page :
5362
Abstract :
To fabricate the top-emitting organic light-emitting diodes (TEOLEDs) with an improved device performance, an n-type indium oxide (IO) was deposited as the transparent conducting capping layer, by using ion beam-assisted deposition (IBAD) technique, on the device of glass/Ag (100 nm)/ITO (100 nm)/2-TNATA (60 nm)/NPB (20 nm)/Alq3 (40 nm)/LiF (1 nm)/Al (2 nm)/Ag (20 nm), and its properties were investigated. To minimize the damage to the organic layers and the oxidation of the top Ag layer during the oxygen IBAD, two-step processing of IO thin film composed of argon IBAD followed by oxygen IBAD was used. The light output of TEOLED fabricated by using the IBAD was similar compared with that of a reference device composed of glass/Ag (100 nm)/ITO (100 nm)/2-TNATA (60 nm)/NPB (20 nm)/Alq3 (40 nm)/LiF (1 nm)/Al (2 nm)/Ag (20 nm)/Alq3 (52 nm), where, Alq3 was used as the semi-passivated capping layer.
Keywords :
organic semiconductors , Top emission , TEOLED , IO , Buffer layer , IBAD
Journal title :
Surface and Coatings Technology
Serial Year :
2007
Journal title :
Surface and Coatings Technology
Record number :
1815623
Link To Document :
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