Nanostructure characterization in single and multi layer yttria stabilized zirconia films using XPS, SEM, EDS and AFM

Single and multiple layers of yttria partially stabilized zirconia (6Y-TZP) nanostructured films were deposited on 304 stainless steel substrate by an electrochemical deposition method. This technique is considered to be an important tool in the formation of nanostructured materials, including monolayer and multilayer films, powders and composites. The aim of the work reported in this paper is the codeposition of two hydroxides, Zr(OH)4 and Y(OH)3, in order to obtain yttria partially stabilized ziconia film, and the preparation of monolayer and multilayer ceramic film of 6Y-TZP. To examine the structure and composition of one layer and three layers of 6Y-TZP deposited on 304 stainless steel, several experimental techniques were used: XPS, XRD, SEM, TEM, EDS and AFM. The XPS technique revealed that zirconia and yttria were present in solid solution. This result was corroborated by XRD. SEM and TEM showed that nanostructured uniform and homogeneous films were obtained. AFM results verified that no deep cracks reached the substrate surface and that little roughness was present on the films.