• Title of article

    Ion beam pattering of nano-gratings on SiC surface

  • Author/Authors

    Katharria، نويسنده , , Y.S. and Kumar، نويسنده , , Sandeep K. Sharma، نويسنده , , A.T. and Chauhan، نويسنده , , Devki and Kanjilal، نويسنده , , D.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2009
  • Pages
    4
  • From page
    2442
  • To page
    2445
  • Abstract
    Morphological evolution of 6H-SiC (0001) surface induced by elastic Ar+ ions collisions has been studied using atomic force microscopy (AFM). Ion irradiation was performed at an angle of 60° with respect to the surface normal of the samples. Dual-dots appear at SiC surface at initial ion fluence (ϕ) of 6 × 1016 cm− 2, while the surface undergoes a self-organization into wavy grating-like ripples features at higher ϕ values. These features show a visual dispersion behavior for white light. Observed features such as amplitude and wavelength of the ripples are explained by taking into account the linear continuum model of Bradley and Harper (BH) and its subsequent modifications.
  • Keywords
    sputtering , Ripples , atomic force microscopy , Nano-dots
  • Journal title
    Surface and Coatings Technology
  • Serial Year
    2009
  • Journal title
    Surface and Coatings Technology
  • Record number

    1820771