Title of article
Ion beam pattering of nano-gratings on SiC surface
Author/Authors
Katharria، نويسنده , , Y.S. and Kumar، نويسنده , , Sandeep K. Sharma، نويسنده , , A.T. and Chauhan، نويسنده , , Devki and Kanjilal، نويسنده , , D.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
4
From page
2442
To page
2445
Abstract
Morphological evolution of 6H-SiC (0001) surface induced by elastic Ar+ ions collisions has been studied using atomic force microscopy (AFM). Ion irradiation was performed at an angle of 60° with respect to the surface normal of the samples. Dual-dots appear at SiC surface at initial ion fluence (ϕ) of 6 × 1016 cm− 2, while the surface undergoes a self-organization into wavy grating-like ripples features at higher ϕ values. These features show a visual dispersion behavior for white light. Observed features such as amplitude and wavelength of the ripples are explained by taking into account the linear continuum model of Bradley and Harper (BH) and its subsequent modifications.
Keywords
sputtering , Ripples , atomic force microscopy , Nano-dots
Journal title
Surface and Coatings Technology
Serial Year
2009
Journal title
Surface and Coatings Technology
Record number
1820771
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