CuS-based thin films for architectural glazing applications produced by co-evaporation: Morphology, optical and electrical properties

Copper sulphide thin films in the 90–300 nm thickness range have been deposited on soda–lime glass substrates by thermal co-evaporation of Cu and S. Depending on the film thickness, the optical transmittance in the visible region is of about 50% for the thinnest film and 19% for the thickest film, with the corresponding near-infrared transmittance dropping from 11% to near-zero at 2500 nm as the film thickness increases from 90 to 300 nm. A resistivity of ρ ~ 10− 4 Ω cm has been obtained for the films. The optoelectronic properties of the films remained practically unchanged after one year stored under laboratory ambient. The optical properties obtained for selected CuS-based films make them suitable for their use as effective solar control glazings in warm climates.