Carburizing of zirconium using a low energy Mather type plasma focus

Carburizing of zirconium is achieved using the energetic carbon ions emitted from a low energy (1.45 kJ) Mather type plasma focus device operated with methane. The zirconium samples are placed at a fix axial distance from a hollow tapered copper anode for the exposure to different carbon ion dose. The peak intensity ratios of the D-band to G-band (ID/IG), G-peak position and G-linewidth in the Raman spectra of treated samples are used to verify the existence and variation of sp2 and sp3 hybridized carbon content. ZrC phase in the irradiated samples is confirmed by X-ray diffraction analyses. A gradual increase of carbon concentration in the exposed samples as a function of ion dose is found in energy dispersive X-ray spectroscopy analyses. The crystallites growth and variation in surface smoothness with increasing ion dose exposure is revealed by scanning electron microscope results. Maximum hardness of about 8.51 ± 0.60 GPa, approximately 5 times as compared to that of pristine zirconium surface, is evident for the sample exposed to 60 plasma focus discharges.