Title of article :
Abrasion resistance of thin film coatings as measured by diffuse optical scattering
Author/Authors :
Evans، نويسنده , , Drew and Zuber، نويسنده , , Kamil and Hall، نويسنده , , Colin and Griesser، نويسنده , , Hans J. and Murphy، نويسنده , , Peter، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Abstract :
In this study, the abrasion resistance of a reflective thin film multilayer system consisting of Chromium Nitride (CrNx) layers deposited on specially prepared coated polymeric substrates is presented. The abrasion resistance is quantified by the Bayer abrasion test, and then correlated with the physical properties of the film. Their resistance to abrasion is identified as being defined partially by the microstructure of the layers within the multilayer system. Relative measures of the abrasion resistance are made by quantifying the surface roughness in the specific case where the substrate is the same (hardness and elastic moduli) and the elemental and phase composition of the coating is the same. Importantly, the optical measurement of the diffuse reflectance is used to assess the relative structure of the coatings prior to the abrasion test. By doing so, a useful, non-destructive technique is presented for characterising the relative abrasion resistance of sputtered thin film coatings.
Keywords :
Micro-scale abrasion , optical spectroscopy , surface topography , Hardness , Nanoindentation , PVD coatings
Journal title :
Surface and Coatings Technology
Journal title :
Surface and Coatings Technology