Title of article :
X-ray elastic strain analysis of compressed Au thin film on polymer substrate
Author/Authors :
Faurie، نويسنده , , D. and Renault، نويسنده , , P.-O. and Le Bourhis، نويسنده , , E. and Drouet، نويسنده , , M. and Goudeau، نويسنده , , P.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
5
From page :
322
To page :
326
Abstract :
In this paper, we have compressed a strongly {111}-fiber textured gold film deposited onto a pre-stretched polymer (Kapton) substrate. The elastic strains were measured using an in situ X-ray diffraction technique. We have performed strain analysis for two geometries called longitudinal and transverse. The Neerfeld–Hill model allows capturing with a few discrepancies the non-linear experimental curves obtained in the two configurations. In contrast, the evolution of the average of the longitudinal and transverse strains as a function of sin2 Ψ is shown to be linear. This emphasizes the measurement accuracy during the compression test and is explained by the elastic grain-interaction independence of the averaged strains, even for a compression test. Moreover, we found that the gold film deforms elastically up to − 0.7% (about − 640 MPa).
Keywords :
Elastic behavior , flexible substrate , X-ray strain , X-ray diffraction
Journal title :
Surface and Coatings Technology
Serial Year :
2013
Journal title :
Surface and Coatings Technology
Record number :
1827083
Link To Document :
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