• Title of article

    DISLOCATIONS STRUCTURE AND SCATTERING PHENOMENON IN CRYSTALLINE CELL SIZE OF 2024 AL ALLOY DEFORMED BY ONE PASS OF ECAP AT ROOM TEMPERATURE

  • Author/Authors

    Goodarzy، M. H. نويسنده School of Metallurgy and Materials Engineering, Iran university of Science & Technology, Tehran, Iran. , , ARABI، H. نويسنده , , Boutorabi، M. A. نويسنده Center of Excellence for High Strength Alloys Technology (CEHSAT), School of Metallurgy and Materials Engineering, Iran University of Science and Technology, Tehran, Iran. , , Seyedein، S. H. نويسنده Center of Excellence for Advanced Materials and Processing (CEAMP), School of Materials and Metallurgical Engineering, Iran University of Science and Technology, Tehran, Iran. , , Shahrokhi، H. نويسنده Department of mechanical Engineering, Azad University Saveh Branch, Iran. ,

  • Issue Information
    فصلنامه با شماره پیاپی 41 سال 2014
  • Pages
    12
  • From page
    27
  • To page
    38
  • Abstract
    Variation in microstructural features of 2024 aluminum alloy plastically deformed by equal channel angular pressing (ECAP) at room temperature, was investigated by X-Ray diffraction in this work. These include dislocation density; dislocation characteristic and the cell size of crystalline domains. Dislocations contrast factor was calculated using elastic constants of the alloy such as C11, C22 and C44. The effect of dislocations contrast factor on the anisotropic strain broadening of diffraction profiles was considered for measuring the microstructural features on the base of the modified Williamson-Hall and Warren-Averbach methods. Results showed that the dislocations density of the solution annealed sample increased from 4.28×1012m-2 to 2.41×1014m-2 after one pass of cold ECAP and the fraction of edge dislocations in the solution annealed sample increased from 43% to 74% after deformation. This means that deformation changed the overall dislocations characteristic more to edge dislocations. Also the crystalline cell size of the solution annealed sample decreased from 0.83?m to about 210nm after one pass of ECAP process at room temperature.
  • Journal title
    Iranian Journal of Materials Science and Engineering
  • Serial Year
    2014
  • Journal title
    Iranian Journal of Materials Science and Engineering
  • Record number

    1827660