Application of single point imaging (SPI) to solid state materials

Single Point Imaging (SPI) is a 3D phase encoding MRI method proposed by S. Emid and J.H.N. Creyghton [1] to study solid state materials with a very short T2 value (>50 μs). In this short communication experimental results of SPI applications to various industrial important solid materials, such as porosity of chocolate samples, connectivity of micro-channels in earth samples, etc. are reported.