Title of article :
Theoretical and numerical analyses on multi-layered ceramic capacitors due to high pressure and elevated temperature
Author/Authors :
Jen، نويسنده , , Ming-Hwa R. and Wu، نويسنده , , Ying-Hui and Guo، نويسنده , , Pei-Ling، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Abstract :
The manufacturing process may cause the deformation and internal defects in multi-layered ceramic capacitors (MLCCs) that result in the malfunction of applications. This work aims to investigate the deformation of MLCCs that are composed of nearly a hundred of BaTiO3 and Ni electrode films interleaved and stacked due to high pressure at elevated temperature.
oretical analysis, classical laminated plate theory, linear elastic assumptions and equilibrium equations were adopted. Associated with the practical process three types of boundary conditions (BCs) were used, such as all edges simple-supported, two edges simple-supported and the other two free, and four edges free. Also, two more conditions need to be added, including four fixed points at corners and the elastic foundation at bottom. As for the numerical simulation the finite element method (FEM) incorporated with software ANSYS was used to obtain the displacement field of MLCCs to validate the analytical prediction. Compared with the numerical results the analytical solutions were found satisfactorily acceptable, i.e., the errors were about 0.1%–6.2% for the BCs of four edges free and four corners fixed. The errors about 0.13%–6.15% were also acceptable for the BCs of two edges simple-supported and the others free. However, the analytical solution for the case of all the edges simple-supported did not agree well with the numerical results. Finally, the achieved analytical methodology offers another choice of handling MLCCs theoretically without using the numerical simulation methods incorporated with commercial softwares, such as FEM and ANSYS, to analyze a nearly and over hundred layered MLCCs.
Keywords :
Theoretical derivation , Multi-layered ceramic capacitors , STRESS , Finite element analysis , Deformation
Journal title :
Surface and Coatings Technology
Journal title :
Surface and Coatings Technology