Author/Authors :
Pookat، نويسنده , , G. and Thomas، نويسنده , , H. and Thomas، نويسنده , , S. and Al-Harthi، نويسنده , , S.H. and Raghavan، نويسنده , , L. and Al-Omari، نويسنده , , I.A. and Sakthikumar، نويسنده , , D. and Ramanujan، نويسنده , , R.V. and Anantharaman، نويسنده , , M.R.، نويسنده ,
Abstract :
Ultra thin films based on CoFe were prepared from a composite target employing thermal evaporation. The microstructure of the films was modified by thermal annealing. The relationship between microstructure and magnetic properties of the films was investigated using techniques like glancing angle X-ray diffraction (GXRD), transmission electron microscopy (TEM) and vibrating sample magnetometry (VSM). The GXRD and TEM investigations showed an onset of crystallization of CoFe at around 373 K. The magnetic softness of the films improved with thermal annealing but at higher annealing temperature it is found to be deteriorating. Annealing induced modification of surface morphology of the alloy thin films was probed by atomic force microscopy (AFM). Surface smoothening was observed with thermal annealing and the observed magnetic properties correlate well with surface modifications induced by thermal annealing.
Keywords :
CoFe based thin films , Thermal annealing , nanocrystallization , Surface smoothening