Title of article
Novel yield model for integrated circuits with clustered defects
Author/Authors
Lee-Ing Tong، نويسنده , , Li-Chang Chao، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
8
From page
2334
To page
2341
Keywords
Clustered defects , General regression neural network , pattern , Yield model , IC
Journal title
Expert Systems with Applications
Serial Year
2008
Journal title
Expert Systems with Applications
Record number
187048
Link To Document