Structural surface investigations with low-energy backscattered electrons

The development of electron spectroscopies based on inelastic scattering fine structure is driven mainly by the need for structural methods which allow the investigation of the geometrical environment of different atomic species of the surface region of the sample. The EELFS (Extended Energy Loss Fine Structure) technique, using low-kinetic-energy electrons (1000–2000 eV) in reflection geometry, has been proven a useful tool for local structural investigation of clean surfaces, thin films and chemisorbed species. The main appeal of this technique, besides its experimental accessibility, is that the data analysis follows the procedure used for EXAFS (Extended X-ray Absorption Fine Structure) spectroscopy to obtain the atomic selectivity, the radial distribution function, the coordination number and the thermal and anisotropic effects. The near-edge energy-loss feature has been used to investigate the density of empty states close to EF and it appeeal particularly sensitive for following the structural changes and for discriminating among various phases and compound formations which occur in the surface region. In this work I review some recent developments, applications and theoretical considerations of the EELFS technique to give local structural parameters and to assess the basic mechanisms which dominate the low-energy electron-surface interaction.